With X-ray diffraction we look into the crystal lattice of crystalline materials and measure distances between crystal planes in nanometre scale. This data is used for:
Material identificationBy measuring lattice constants we can identify e.g. corrosion products, metal alloys and many contamination particles or deposits. Residual stress Surface residual stress is important for fatigue life of highly loaded components and components subjected to numerous loads in their lifetime. Measuring surface residual stress by XRD is a non-destructive technique. Retained austenite The content of retained austenite is important in hardened parts with tight fitting, because transformation of retained austenite to ferrite causes a volume expansion.
Henning S. Sørensen Lead Consultant, Materials & Procces 0045 7488 2309
Dorthe Johansen Consultant 0045 7488 2295