X-ray diffraction (XRD)

  • With X-ray diffraction we look into the crystal lattice of crystalline materials and measure distances between crystal planes in nanometre scale. This data is used for:

    Material identification
    By measuring lattice constants we can identify e.g. corrosion products, metal alloys and many contamination particles or deposits.

    Residual stress
    Surface residual stress is important for fatigue life of highly loaded components and components subjected to numerous loads in their lifetime. Measuring surface residual stress by XRD is a non-destructive technique.

    Retained austenite
    The content of retained austenite is important in hardened parts with tight fitting, because transformation of retained austenite to ferrite causes a volume expansion. 


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